Probing power laws in multifrequency AFM

Quantification of conservative forces in multifrequency atomic force microscopy requires solving the general equations theory expressed terms virials interaction. Power law expressions are commonly utilized when dealing with electrostatic, ferroelectric, magnetic, or long range (van der Waals) forces. Here, we discuss modeled power laws (n), where exponent n covers = 2–5, and employ to explore relevant parameter space. Numerical integration motion suggest that only a narrow operational parameters available imaging approximations valid. Albeit these conditions exist, corresponding errors can be as low 10% throughout for all exponents explored.